DFT


1. Introduction to Testing

1.1. Purpose of  DFT

1.2. Controllability and Observability

1.3. Pros and Cons of DFT

2. CMOS Failures

2.1. Stuck at Faults Modeling

            2.2. Single Stuck at models

2.3. Limitations of Combinational Logic Testing

            2.4. Determining Fault Coverage

            2.5. Fault Simulation

3. Automatically Generating Test Patterns

            3.1. Random pattern generation

3.2. Deterministic pattern generation

4. Testing Sequential Elements Using Scan

            4.1. Scan Shift Mode

            4.2. Scan Capture Mode

5. Internal Full Scan

             5.1. Muxed Scan

5.1.1.  Characteristics of Multiplexed Flip-Flop Scan Style

             5.2. Clocked Scan

5.2.1. Characteristics of Clocked-Scan Scan Style 

             5.3. Test Port Requirements

             5.4. Disadvantage of Scan Insertion

6. Boundary Scan – JTAG

             6.1. The Boundary-Scan Cell

                       6.1.1. Boundary Scan Cell Parallel Mode of Operation

                       6.1.2.  Boundary Scan Cell Serial Mode of Operation

             6.2. Test Access Port (TAP) Controller

             6.3. Boundary Scan Architecture Registers

                        6.3.1. Instruction Register

                        6.3.2. Bypass Register

                        6.3.3. Device Identification Register

                        6.3.4. Boundary Scan Register

              6.4. Basic Boundary Scan Cell

              6.5. Boundary Scan Design Flow

              6.6. Boundary-Scan Description Language (BSDL)

7.0.  BIST - Built In Self Test

7.0.1. Advantages of BIST

7.0.2. Disadvantages of BIST

7.0.3. Prequisites to BIST insertion

7.2. Types of BIST techniques

7.2.1. Logic BIST (LBIST)

7.2.2. Memory BIST (MBIST)

8. DFT Design Rule Check (DFT-DRC)

             8.1. Asynchronous Set/Reset Signals

             8.2. Generated clocks

             8.3. Gated Clocks

             8.4. Combinational Feedback Loops

             8.5. Bi-Directional I/O Ports

             8.6. Tri-State buses

9. Outputs from DFT

References:
[AGB] Essentials of Electronic testing, V D Agarwal and M L Bushell
[ABR] Digital System testing and Testable Design, M Abramovici et all
[FUJ] Logic Testing and Design for Testability, H Fujiwara
[SYN] Synopsys DFT Compiler User Guide
[CAD] Cadence RTL-Compiler DFT User Guide
[BEN] Boundary Scan Tutorial, Dr R G Ben Bennetts, ASSET InterTech Inc, www.dft.co.uk
(Now broken); available at below link:
[SIL] http://www.siliconfareast.com/bist.htm (now broken); available at below link:
[UBC] http://courses.ece.ubc.ca/578/notes2.pdf


9 comments:

  1. hi,
    First of all, Thanks for wonderful blog on the ASIC soc.
    I would like to know where will i get the details of above mentioned link.
    Please provide the link for the above topic.

    Regards,
    Vijay

    ReplyDelete
  2. Hi Vijay,
    I will update the link with contents soon....

    Thanks
    asicsocblog

    ReplyDelete
  3. Can u update more details about DFT

    ReplyDelete
  4. Wow. I wanna learn all that. Please provide me with all the materials on DFT. If possible any ebooks also.
    Thanks in Advance

    ReplyDelete
  5. hiiii
    please can u provide the link for the above topics

    ReplyDelete
  6. hi
    Can you tell which are the various companies that deal in DFT ( in India if possible ) ??

    ReplyDelete
    Replies
    1. hi Gaurav,
      Most of the semiconductor product companies like broadcom, amd, nvidia etc work on dft, service companies like mirafra, synapse, smartplay also have dft teams.

      Delete
  7. Please.
    When the links will be able?

    ReplyDelete
  8. Sorry.. i couldn't update all links as i wished to do... But i will be doing as and when i get some time myself !

    ReplyDelete

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